pyMFD Documentation#
pyMFD makes analyzing force-volume data for multipoint force-deflection (MFD) simple. MFD is a new method for characterizing suspended thin films. Small (e.g. 1 µm x 2 µm) cantilevers are cut (or etched) into a suspended thin film and then an atomic force microscope (AFM) is used to record many force-deflection ramps on and around the cantilever (using a force-volume scan). pyMFD provides the capability to load the force-volume data, summarize each force-deflection ramp into a mechanical compliance, and fit the compliance data on the cantilever to estimate Young’s modulus.